Abstract
The phase separation of ether-type phenylene vinylene based copolymer (ether-PPV) and cyano-substituted poly(2,5-didecyloxy-p-phenylene vinylene) (CNPPV) films was studied using force modulation microscopy (FMM). The influences of tip spring constant and modulation frequency on the FMM examination of the polymer blend phase separation were determined. Using the stiffest tip can yield consistent and correct image contrast.