Foreword for the Special Issue on VLSI Testing

Journal article

Peer reviewed

C.-W. Wu, K.-J. Lee and Y.-L. Lin

Journal of Information Science and Engineering, Vol.16(5)

09/2000

Abstract

VLSI testing

Information Science;Engineering

1 Record Views

Title: Foreword for the Special Issue on VLSI Testing
Creators - without role: C.-W. Wu
K.-J. Lee
Y.-L. Lin
Publication Details: Journal of Information Science and Engineering, Vol.16(5)
Identifiers: 9957775628106774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Journal article