Logo image
Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm
期刊文章   開放取用(OA)

Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

Tsung-Yu Chen, Yu-Tung Chen, Cheng-Liang Wang, Ivan M. Kempson, Wah-Keat Lee, Yong S. Chu, Y. HwuG. Margaritondo
Optics Express, 卷.19(21), 頁碼.19919-19924
10/2011
PMID: 21997000

摘要

Atomic and Molecular Physics and Optics
Fresnel zone plates (450 nm thick Au, 25 nm outermost zone width) used as objective lenses in a full field transmission reached a spatial resolution better than 20 nm and 1.5% efficiency with 8 keV photons. Zernike phase contrast was also realized without compromising the resolution. These are very significant achievements in the rapid progress of high-aspect-ratio zone plate fabrication by combined electron beam lithography and electrodeposition. © 2011 Optical Society of America.

檔案與連結 (1)

url
https://doi.org/10.1364/OE.19.019919檢視
已出版(紀錄版本) 開放

相關連結

指標

1 檢視次數

詳細資料

Logo image