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Fully Integrated GaN-on-Silicon Gate Driver and GaN Switch With Temperature-Compensated Fast Turn-on Technique for Achieving Switching Frequency of 50 MHz and Slew Rate of 118.3 V/Ns
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Fully Integrated GaN-on-Silicon Gate Driver and GaN Switch With Temperature-Compensated Fast Turn-on Technique for Achieving Switching Frequency of 50 MHz and Slew Rate of 118.3 V/Ns

Yu-Yung Kao, Sheng-Hsi Hung, Hsuan-Yu Chen, Jia-Jyun Lee, Ke-Horng Chen, Ying-Hsi Lin, Shian-Ru Lin 和 Tsung-Yen Tsai
IEEE journal of solid-state circuits, 卷.56(12), 頁碼.3619-3627
01/12/2021
Web of Science ID: WOS:000722004000012

摘要

Fast turn-on (FTO) technique Gallium nitride Gallium nitride (GaN) HEMTs Logic gates miller plateau voltage Pulse width modulation Switches Temperature measurement temperature-compensated (T-compensated) Threshold voltage Voltage control

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