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Generalized confidence intervals for the process capability index C pm
Journal article   Peer reviewed

Generalized confidence intervals for the process capability index C pm

Bi-Min Hsu, Chien-Wei Wu and Ming-Hung Shu
Metrika, Vol.68(1), pp.65-82
06/2008

Abstract

Generalized confidence intervals Generalized pivotal quantities Lower confidence limits Process capability index
Process capability indices have been proposed to the manufacturing industry for measuring process reproduction capability. The C pm index takes into account the degree of process targeting (centering), which essentially measures process performance based on average process loss. To properly and accurately estimate the capability index, numerous conventional approaches have been proposed to obtain lower limits of the classical confidence intervals (CLCLs) for providing process capability information. In particular, lower confidence limits (LCLs) not only provide critical information regarding process performance but are used to determine if an improvement was made in reducing the nonconforming percent and the process expected loss. However, the conventional approach lacks for exact confidence intervals for C pm involving unknown parameters which is a notable shortcoming. To remedy this, the method of generalized confidence intervals (GCIs) is proposed as an extension of classical confidence intervals (CCIs). For evaluating practical applications, two lower limits of generalized confidence intervals (GLCLs) for C pm using generalized pivotal quantities (GPQs) are considered, (i) to assess the minimum performance of one manufacturing process/one supplier, and (ii) to assess the smallest performance of several manufacturing processes/several suppliers for equal as well as unequal process variances. © 2007 Springer-Verlag.

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