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Hard x-ray Zernike microscopy reaches 30 nm resolution
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Hard x-ray Zernike microscopy reaches 30 nm resolution

Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent GajdosikG. Margaritondo
Optics Letters, 卷.36(7), 頁碼.1269-1271
04/2011
PMID: 21479054

摘要

Atomic and Molecular Physics and Optics
Since its invention in 1930, Zernike phase contrast has been a pillar in optical microscopy and more recently in x-ray microscopy, in particular for low-absorption-contrast biological specimens. We experimentally demonstrate that hard-x-ray Zernike microscopy now reaches a lateral resolution below 30 nm while strongly enhancing the contrast, thus opening many new research opportunities in biomedicine and materials science. © 2011 Optical Society of America.

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