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Hydrogen-desorption kinetic measurement on the Si(100)-2×1:H surface by directly counting desorption sites
Journal article   Peer reviewed

Hydrogen-desorption kinetic measurement on the Si(100)-2×1:H surface by directly counting desorption sites

Deng-Sung Lin and Ru-Ping Chen
Physical Review B - Condensed Matter and Materials Physics, Vol.60(12), pp.R8461-R8464
1999

Abstract

Hydrogen-desorption;kinetic measurement;Si(100) Electronic Optical and Magnetic Materials,Condensed Matter Physics
The desorption kinetics of hydrogen from the Si(100)-2×1:H monohydride surface was investigated by means of variable-temperature scanning-tunneling microscopy (STM) in the temperature range between 590 and 668 K. By directly counting the number of desorption sites in the STM images for various annealing time at several temperatures, an activation barrier of E d =2.22±-0.20 eV and a pre-exponential factor of v d =3.4×10 13±-0.3 s -1 for the H 2 recombinative desorption are deduced. The sequential images acquired in real times show that hydrogen desorbs in a random manner and the interaction between two neighboring paired dangling bond sites is repulsive. © 1999 The American Physical Society.

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