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Impact crack propagation through the dual-phased (Cu,Ni)                     6Sn                     5 layer in Sn-Ag-Cu/Ni solder joints
Journal article

Impact crack propagation through the dual-phased (Cu,Ni) 6Sn 5 layer in Sn-Ag-Cu/Ni solder joints

Shao-Wei Fu, Chi-Yang Yu, Tae-Kyu Lee, Kuo-Chuan Liu and Jenq-Gong Duh
Materials Letters, Vol.80, pp.103-105
01/08/2012

Abstract

Electronic materials Indentation and hardness Interfaces Metallurgy Microstructure
The interfacial reactions of the Sn-3Ag-0.75Cu/Au/Ni solder joint before and after aging were investigated. The dual-phased (Cu,Ni) 6 Sn 5 with high (20.6 at.%) and low Ni (5.7 at.%) contents formed at the Sn-Ag-Cu/Ni interface, represented as H-(Cu,Ni) 6 Sn 5 and L-(Cu,Ni) 6 Sn 5, respectively. By employing high-speed impact test, the impact fracture morphology reveals that the H-(Cu,Ni) 6 Sn 5 /L-(Cu,Ni) 6 Sn 5 interface facilitates the crack nucleation within the intermetallic compound (IMC). The indentation data shows that bulk H-(Cu,Ni) 6 Sn 5 exhibits distinctly higher hardness and lower fracture toughness than bulk L-(Cu,Ni) 6 Sn 5 . In correlating the impact fracture behavior and mechanical properties of H-(Cu,Ni) 6 Sn 5 and L-(Cu,Ni) 6 Sn 5 , cracks tend to propagate through the H-(Cu,Ni) 6 Sn 5 IMC due to the relatively low fracture toughness of H-(Cu,Ni) 6 Sn 5 . In addition, mechanisms for the formation of the dual-phased (Cu,Ni) 6 Sn 5 IMC are discussed in details. © 2012 Published by Elsevier B.V. All rights reserved.

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