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Improved resistive switching of textured ZNO thin films grown on ru electrodes
Journal article   Peer reviewed

Improved resistive switching of textured ZNO thin films grown on ru electrodes

Zi-Jheng Liu, Jen-Chun Chou, Shih-Yuan Wei, Jon-Yiew Gan and Tri-Rung Yew
IEEE Electron Device Letters, Vol.32(12), pp.1728-1730
12/2011

Abstract

Nonvolatile memory Resistance random access memory Resistive switching ZnO
This letter investigates the unipolar resistive switching behaviors of sputtered ZnO thin films by changing the electrode combinations of Pt and Ru, creating four sandwich structures of Pt/ZnO/Pt, Pt/ZnO/Ru, Ru/ZnO/Pt, and Ru/ZnO/Ru. Only the Pt/ZnO/Ru devices in this letter achieved favorable resistive switching characteristics, including good endurance performance, narrow distributions in switching parameters, high on/off ratio ( 150), and clear difference between the set and reset voltages (1 V). This may be attributed to the low oxygen affinity of Pt electrodes and the strongaxis texture of ZnO thin films grown on Ru electrodes. © 2006 IEEE.

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