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In Situ Electrical Characterization of Carbon Nanotubes in O2 and N2 Plasma to Explain their Field Emission Instability
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In Situ Electrical Characterization of Carbon Nanotubes in O2 and N2 Plasma to Explain their Field Emission Instability

Yen-Hung Kuo, Jen-Kuang Fang, Jen-Chun Chen, Pai-Sheng Shih, Ping-Chun Chen, Yung-Kai Yang, Hsin-Jung TsaiWen-Kuang Hsu
ACS Applied Nano Materials, 卷.7(13), 頁碼.15648-15654
07/2024

摘要

carbon nanotubes electrical measurements field emission oxygenation plasma Materials Science (all)
Due to oxygenation, carbon nanotubes cannot operate field emission for a long period of time. So far, the emission-induced oxygenation mechanism has not been studied in detail; particularly, the underlying mechanism that causes a drastic increase of the emitting current contiguous to the turn-on voltage remains unclear. Cold plasma is a nonthermal equilibrium process and can also oxygenate carbon materials through radiolysis. In this work, electrical measurements of single-walled carbon nanotubes are in situ carried out in O 2 and N 2 plasma irradiation, and the tube resistance due to irradiative damages is found to increase in three steps, defined as regions I, II, and III. In region I, the increase is rapid and involves extraction of intercalated O 2 between the nanotubes. The nanotubes become severely oxygenated in region II, thus enhancing the on-tube scattering and resistance. Nanotube segmentation takes place in region III, where the opened edges are likely bonded with oxygenated and nitride groups. Experimental data successfully explain the field emission instability of carbon nanotubes, including a low life cycle, sudden increase in emitting current around the turn-on voltage, and thermal decomposition of carbon lattices.

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https://doi.org/10.1021/acsanm.4c02655檢視
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