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In-Situ Monitoring Of Monolayer Formation On Chemically Oscillating Oil/Liquid Interface By Quasielastic Laser Scattering
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In-Situ Monitoring Of Monolayer Formation On Chemically Oscillating Oil/Liquid Interface By Quasielastic Laser Scattering

Satoshi Takahashi, Akira Harata, Takehiko KitamoriTsuguo Sawada
Analytical Sciences, 卷.7, 頁碼.645-648
1991

摘要

chemical oscillation interfacial tension quasielastic laser scattering ripplon Analytical Chemistry
A quasielastic laser scattering method was applied to monitoring the oil/water interface of chemical oscillation. Interfacial capillary wave (ripplon) frequencies were measured to estimate the change of interfacial tension during the electric potential oscillation. According to the conventional model of this chemical oscillation, a change in interfacial tension occurs due to formation and disappearance processes of a monolayer at the interface. However, no significant change in the interfacial tensions was detected from the ripplon frequency before and after the potential pulse generation. © 1991, The Japan Society for Analytical Chemistry. All rights reserved.

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https://doi.org/10.2116/analsci.7.Supple_645檢視
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