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In Situ TEM Observation of Atomic-Level Shear Deformation for Nano Tribological Research
Journal article   Open access

In Situ TEM Observation of Atomic-Level Shear Deformation for Nano Tribological Research

隆昭 佐藤, T. Ishida, L. Jalabert and H. Fujita
Microscopy and Microanalysis, Vol.17(S2), pp.1372-1373
01/07/2011

Abstract

TEM;Nano Tribological Research

Monitoring the atomic-level shear deformation while detecting the shear force in real-time is an important step to elucidate the mechanism of lubrication. This is because the frictional interface is composed of multiple tiny shear deformations. However, observing the nano-scale shear deformation is a great challenge due to some experimental difficulties. In this research, we have developed a technique to combine MEMS (Micro Electro Mechanical Systems) technology with TEM (Transmission Electron Microscopy)(1, 2) to monitor shear deformation and shear force simultaneously.

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https://doi.org/10.1017/S1431927611007732View
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