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In situ STEM Mechanical Experiments at Atomic-Resolution Using a MEMS Device
Journal article   Open access

In situ STEM Mechanical Experiments at Atomic-Resolution Using a MEMS Device

Eita Tochigi, 隆昭 佐藤, Naoya Shibata, Hiroyuki Fujita and Yuichi Ikuhara
Microscopy and Microanalysis, Vol.25(S2), pp.1884-1885
01/08/2019

Abstract

STEM;atomic-resolution;MEMS device
url
https://doi.org/10.1017/S1431927619010158View
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