In situ Error Estimation for Topographic Height Measured from Frequency-Modulated Atomic Force Microscopy

Journal article

Peer reviewed

K. -M. Yang, J. Y. Chung and D.-S. Lin

Japanese Journal of Applied Physics, Vol.46, p.4395

2007

Abstract

Error Estimation;Topographic;Height Measured;Frequency-Modulated;Atomic Force Microscopy

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Title: In situ Error Estimation for Topographic Height Measured from Frequency-Modulated Atomic Force Microscopy
Creators - without role: K. -M. Yang
J. Y. Chung
D.-S. Lin - 國立清華大學理學院物理學系
Publication Details: Japanese Journal of Applied Physics, Vol.46, p.4395
Identifiers: 9957776265106774
Academic Unit: Department of Physics, College of Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Journal article