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Integrated voltage reference generator for GaN smart power chip technology
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Integrated voltage reference generator for GaN smart power chip technology

King-Yuen Wong, Wanjun ChenKevin J. Chen
IEEE Transactions on Electron Devices, 卷.57(4), 頁碼.952-955
04/2010

摘要

AlGaN/GaN HEMT GaN Planar integration Smart power Voltage reference Wide bandgap Electronic Optical and Magnetic Materials Electrical and Electronic Engineering
GaN smart power chip technology has been realized using a GaN-on-Si HEMT platform, featuring monolithically integrated high-voltage power devices and low-voltage peripheral devices for mixed-signal functional blocks. In particular, this brief presents the imperative analog functional blockvoltage reference generator for smart power applications with wide-temperature-range stability. The circuit is capable of proper functions within a wide temperature range from room temperature up to 250°C , illustrating the unique advantage of the wide-bandgap GaN in high-temperature operation. The voltage reference generator was designed with an AlGaN/GaN HEMT and Schottky diodes, and the devices were operated in the subthreshold regime to obtain low power consumption. The voltage reference generator achieved an average drift of less than 0.5 mV/°C and can be used as a reference voltage in various biasing and sensing circuits. © 2010 IEEE.

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