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Intense terahertz emission from a -plane InN surface
Journal article   Open access   Peer reviewed

Intense terahertz emission from a -plane InN surface

H. Ahn, Y.-P. Ku, C.-H. Chuang, C.-L. Pan, H.-W. Lin, Y.-L. Hong and S. Gwo
Applied Physics Letters, Vol.92(10), 102103
2008

Abstract

We report a significant enhancement in terahertz emission from the indium nitride (InN) films grown along the a axis (a -plane InN), relative to the InN films grown along the c axis. The primary radiation mechanism of the a -plane InN film is found to be due to the acceleration of photoexcited carriers under the polarization-induced in-plane electric field perpendicular to the a axis, which effectively enhances the geometrical coupling of the radiation out of semiconductor. In addition, azimuthal angle dependence measurement shows that the p -polarized terahertz output consists of a large angularly independent component and a weak component with a distinctive fourfold rotation symmetry. © 2008 American Institute of Physics.
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