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Interface densification in a microphase-separated diblock copolymer resolved by small-angle X-ray scattering
Journal article   Open access   Peer reviewed

Interface densification in a microphase-separated diblock copolymer resolved by small-angle X-ray scattering

Yu-Hsuan Lin, Yu-Chung Chen, Aditya Sahare, Yi-Cheng Lai, Chun-Jen Su, Jing-Cherng Tsai, Katsuhiro Yamamoto and Hsin-Lung Chen
Journal of applied crystallography, Vol.58(Pt 3), pp.869-878
06/2025
PMID: 40475943

Abstract

Research Papers
The electron density distribution along the lamellar normal in a block co­poly­mer, as determined by small-angle X-ray scattering, reveals segmental densification at the domain interface. This interfacial densification is attributed to the negative mixing volume in the segmental mixture of the constituent blocks, a distinct characteristic of block copolymers exhibiting lower critical ordering transition or hourglass phase behavior. In block copolymers exhibiting lower critical ordering transition behavior, the segregation strength increases with temperature due to the significantly different thermal expansivities of the constituent blocks. Using synchrotron small-angle X-ray scattering, we reveal a phenomenon of segmental densification at the microdomain interface in this type of system, where the local electron density in a specific region of the interface surpasses that of the denser domain. As a result, the interfacial electron density profile deviates significantly from the hyperbolic tangent function expected for an incompressible melt. This unique densification effect can be attributed to the negative volume of mixing at the interface between the dissimilar segments and emerges when the electron densities of the constituent blocks are similar.
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https://doi.org/10.1107/S1600576725002638View
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