摘要
We demonstrate two interferometric methods for mea-suring the thickness of nematic liquid crystal films with a free surface. The accuracy of either method is better than ±1%. © 1989, Optical Society of America.
- 題名
- Interferometric measurements of the thickness of nematic liquid crystal films with a free surface
- 創作者：
- Shyu-Mou Chen (作者) - National Yang Ming Chiao Tung UniversityRu-Pin Pan (作者) - Electrophysics Department , Institute of Electrooptical EngineeringCi-Ling Pan (作者) - National Chiao Tung University
- 學術資源類型
- 期刊文章
- 出版日期
- 1989
- 出版資訊
- Applied Optics, 卷.28(23), 頁碼.4969-4971
- 語言
- 英語