- 題名
- Investigating the Arc-Shaped Kink Drain Voltage of Drain Current With Capacitance-Voltage Measurement Method in GaN HEMTs
- 創作者：
- Jui Tse Hsu - National Tsing Hua UniversityShawn S.H. Hsu - 國立清華大學, 半導體研究學院Ting Chang Chang - National Sun Yat-sen UniversityChen Hsin Lien - 國立清華大學, 電機資訊學院Ting Tzu Kuo - National Sun Yat-sen UniversityChien Hung Yeh - National Sun Yat-sen UniversityJia Hong Lin - National Sun Yat-sen UniversityYa Huan Lee - National Sun Yat-sen UniversityCheng Hsien Lin - National Sun Yat-sen UniversityWei Chieh Hung - National Sun Yat-sen UniversityI. Yu Huang - National Sun Yat-sen University
- 總頁數
- 5
- 補助款備註
- NSTC 112-2124-M-110-001 / National Science and Technology Council (http://data.elsevier.com/vocabulary/SciValFunders/100020595) National Science and Technology Council (http://data.elsevier.com/vocabulary/SciValFunders/100020595) NSTC / National Science and Technology Council (100020595)
- 學術資源類型
- 期刊文章
- 出版日期
- 01/12/2024
- 出版資訊
- IEEE transactions on device and materials reliability, 卷.24(4), 頁碼.544-548
- 語言
- 英語
期刊文章
Investigating the Arc-Shaped Kink Drain Voltage of Drain Current With Capacitance-Voltage Measurement Method in GaN HEMTs
IEEE transactions on device and materials reliability, 卷.24(4), 頁碼.544-548
01/12/2024
Web of Science ID: WOS:001385381600019
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