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Investigation of 3.3 kV 4H-SiC DC-FSJ MOSFET structures
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Investigation of 3.3 kV 4H-SiC DC-FSJ MOSFET structures

Chia-Yuan Chen, Yun-Kai Lai, Kung-Yen Lee, Chih-Fang HuangShin-Yi Huang
Micromachines, 卷.12(7), 756
07/2021

摘要

4H-SiC Breakdown voltage MOSFET Silicon carbide Specific on-resistance Superjunction Control and Systems Engineering Mechanical Engineering Electrical and Electronic Engineering
This research proposes a novel 4H-SiC power device structure-different concentration floating superjunction MOSFET (DC-FSJ MOSFET). Through simulation via Synopsys Technology Computer Aided Design (TCAD) software, compared with the structural and static characteristics of the traditional vertical MOSFET, DC-FSJ MOSFET has a higher breakdown voltage (BV) and lower forward specific on-resistance (R on,sp ). The DC-FSJ MOSFET is formed by multiple epitaxial technology to create a floating P-type structure in the epitaxial layer. Then, a current spreading layer (CSL) is added to reduce the R on,sp . The floating P-type structure depth, epitaxial layer concentration and thickness are optimized in this research. This structure can not only achieve a breakdown voltage over 3300 V, but also reduce R on,sp . Under the same conditions, the Baliga Figure of Merit (BFOM) of DC-FSJ MOSFET increases by 27% compared with the traditional vertical MOSFET. R on,sp is 25% less than that of the traditional vertical MOSFET.

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https://doi.org/10.3390/mi12070756檢視
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