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Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement
Journal article   Peer reviewed

Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement

Y.C. Chang, C.C. Chang, Ida Chang, J.C. Wu, Zung-Hang Wei, Mei-Feng Lai and Ching-Ray Chang
Journal of Applied Physics, Vol.99(8), 08B710
2006

Abstract

Magnetic properties of microstructured Permalloy thin film cross have been studied using magnetic force microscopy and magnetoresistance measurement. Three types of magnetization configurations formed within the junction area were observed, including two kinds of magnetic pattern having two inward and two outward magnetizations and one with three outward and one inward magnetizations. The presence of those variant magnetic configurations gives rise to an irreversible magnetoresistance behavior originated from the distinct magnetization history. Asynchronous magnetization reversal of each arm provides a chance to manipulate the magnetic pattern of the cross. © 2006 American Institute of Physics.

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