摘要
We report a theoretical investigation of X-ray back diffraction at grazing incidence. Based on the framework of the dynamical theory of X-ray diffraction, the grazing incidence for Si (12 4 0) back diffraction is taken as an example to resolve the eigenvalue problem inside the crystal. The dispersion surface and the resulting diffraction intensities are strongly affected by the miscut angle as well as the diffraction geometry of grazing incidence. The kinematical relationship between the incident angle and the miscut angle is well explained by Snell's law. While only the two-beam diffraction is considered, our treatment can be further extended to include the cases for multiple diffractions as well.