Is IDDQ testing not applicable for deep submicron VLSI in year 2011?

期刊文章

Chih Wen Lu, Chauchin Su, Chung Len Lee 和 Jwu E. Chen

Proceedings - Asian Test Symposium, 頁碼.338-343

2000

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題名: Is IDDQ testing not applicable for deep submicron VLSI in year 2011?
創作者：: Chih Wen Lu - Department of Electrical Engineering, Da Yeh University, Taiwan
Chauchin Su - Dayeh University
Chung Len Lee - National Central University
Jwu E. Chen - Chung Hua University
IEEE COMPUTER SOCIETY
總頁數: 6
學術資源類型: 期刊文章
出版日期: 2000
出版資訊: Proceedings - Asian Test Symposium, 頁碼.338-343
語言: 英語