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Joint modeling of laboratory and field data with application to warranty prediction for highly reliable products
Journal article   Peer reviewed

Joint modeling of laboratory and field data with application to warranty prediction for highly reliable products

Sheng-Tsaing Tseng, Nan-Jung Hsu and Yi-Chiao Lin
IIE Transactions (Institute of Industrial Engineers), Vol.48(8), pp.710-719
02/08/2016

Abstract

empirical Bayes inference Field failure rate prediction go/no-go laboratory data
To achieve a successful warranty management program, a good prediction of a product's field return rate during the warranty period is essential. This study aims to make field return rate predictions for a particular scenario, the one where multiple products have a similar design and discrete-type laboratory data together with continuous-type field data is available for each product. We build a hierarchical model to link the laboratory and field data on failure. The efficient sharing of information among products means that the proposed method generally provides a more stable laboratory summary for each individual product, especially for those cases with few or even no failures during the laboratory testing stage. Furthermore, a real case study is used to verify the proposed method. It is shown that the proposed method provides a better connection between laboratory reliability and field reliability, and this leads to a significant improvement in the estimated field return rate.

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