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Low Phase Noise RF Oscillators Based on Thin-Film Lithium Niobate Acoustic Delay Lines
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Low Phase Noise RF Oscillators Based on Thin-Film Lithium Niobate Acoustic Delay Lines

Ming-Huang Li, Ruochen Lu, Tomas ManzanequeSongbin Gong
Journal of Microelectromechanical Systems, 卷.29(2), 頁碼.129-131
04/2020

摘要

acoustic delay lines lithium niobate Microelectromechanical systems oscillator phase noise piezoelectric transducers Mechanical Engineering Electrical and Electronic Engineering
An RF oscillator has been demonstrated using a wideband SH 0 mode lithium niobate acoustic delay line (ADL). The design space of the ADL-based oscillators is theoretically investigated using the classical linear time-invariant (LTI) phase noise model. The analysis reveals that the key to low phase noise is low insertion loss (IL), large delay (τ G ), and high carrier frequency ( f o ). Two SH 0 ADL oscillators based on a single SH 0 ADL ( f o = 157 MHz, IL = 3.2 dB, τ G = 270ns) but with different loop amplifiers have been measured, showing low phase noise of -114 dBc/Hz and -127 dBc/Hz at 10-kHz offset with a carrier power level of -8 dBm and 0.5 dBm, respectively. These oscillators not only have surpassed other Lamb wave delay oscillators but also compete favorably with surface acoustic wave (SAW) delay line oscillators in performance. [2019-0223].

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