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Low-capacitance low-voltage transient voltage suppressor using diode-activated SiGe heterojunction bipolar transistor in sige heterojunction bipolar transistor bipolar complementary metal-oxide-semiconductor process
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Low-capacitance low-voltage transient voltage suppressor using diode-activated SiGe heterojunction bipolar transistor in sige heterojunction bipolar transistor bipolar complementary metal-oxide-semiconductor process

Sheng-Huei Dai, Jeng-Jie Peng, Chia-Cheng Chen, Chrong-Jung LinYa-Chin King
Japanese Journal of Applied Physics, 卷.48(4 PART 2), 04C082
04/2009

摘要

Engineering (all) Physics and Astronomy (all)
In this paper, a transient voltage suppressor using a diode-activated SiGe heterojunction bipolar transistor (HBT) is proposed. The capacitance, DC current-voltage (I-V) characteristics, and transmission line pulse (TLP) I-V characteristics of this combination device are investigated. An optimization guideline of the combination device is presented, verified by the corresponding simulation results, and a simple and effective method for achieving the target breakdown voltage is demonstrated. By combining the diode and SiGe HBT, the new structure exhibits both a low capacitance and a low breakdown voltage for protection against electrostatic discharge and electrical overstress in discrete or on-chip applications. © 2009 The Japan Society of Applied Physics.

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