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MEMS-in-TEM for Nano Tribology
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MEMS-in-TEM for Nano Tribology

Hiroyuki Fujita, Tadashi Ishida, 隆昭 佐藤Shinsuke Nabeya
Journal of Physics: Conference Series, 卷.258(1)
01/11/2010

摘要

MEMS-in-TEM experimental system;nano junctions;MEMS microactuators

We have developed a MEMS-in-TEM experimental system that enables the mechanical testing of nano junctions by MEMS microactuators in TEM (transmission electron microscope) for in situ atomic level observation of dynamic deformation. A nano junction between two sharp opposing tips was formed by bringing them into contact. Applying either tensile or shearing stress, we observed the elongation and changes in shape of the junction at real-time rate while applied force was measured. The experimental system and results of tensile and shear tests are described.

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url
https://doi.org/10.1088/1742-6596/258/1/012004檢視
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