Logo image
Microscopic origin of black spot defect swelling in single crystal 3C-SiC
期刊文章   同儕審查

Microscopic origin of black spot defect swelling in single crystal 3C-SiC

Ka Yu Fung, Yan Ru Lin, Pei Jun Yu, Ji Jung KaiAlice Hu
Journal of Nuclear Materials, 卷.508, 頁碼.292-298
09/2018

摘要

Black spot defect Irradiation swelling Molecular dynamic Silicon carbide Nuclear and High Energy Physics Nuclear Energy and Engineering Materials Science (all)
In this study, we perform a series of simulation of a high-energy particle irradiation on a 3C-SiC at low temperature through molecular dynamic analysis. In order to determine the formation mechanism of black spot defects (BSD), the evolution of defect clusters during the cascade process is examined. Simulation results show that there are more isolated interstitials scattering across the structure while the less mobile vacancies are concentrated in defect clusters, which is consistent with the depleted zone theory proposed by Brinkman [3]. These results also match the TEM observation and simulation results done by Lin et al. [4] and support the argument that black spot defects are in fact vacancy-rich regions, with individual interstitials spreading into bulk, stretching the lattice structure.

相關連結

指標

1 檢視次數

詳細資料

Logo image