Logo image
Monitoring general linear profiles when random errors have contaminated normal distributions
Journal article   Peer reviewed

Monitoring general linear profiles when random errors have contaminated normal distributions

Longcheen Huwang, Yi-Hua Tina Wang and Cheng-Che Shen
Quality and Reliability Engineering International, Vol.30(8), pp.1131-1144
01/12/2014

Abstract

Average run length Control chart EWMA Out-of-control Phase I Phase II Trimmed least squares estimation
We consider the quality of a process which can be characterized by a general linear profile where the random error has a contaminated normal distribution. On the basis of trimmed least squares estimation, new control charts for monitoring the coefficient parameters and/or the error variance of the profile are proposed. Simulation studies show that the proposed control charts outperform the existing competitors under such a profile. An example from manufacturing facility is used to illustrate the applicability of the proposed charts.

Metrics

1 Record Views

Details

Logo image