Logo image
Multiphoton photoemission electron microscopy using femtosecond laser radiation
期刊文章

Multiphoton photoemission electron microscopy using femtosecond laser radiation

Gerhard H. Fecher, Oliver Schmidt, Yeukuang HwuGerd Schönhense
Journal of Electron Spectroscopy and Related Phenomena, 卷.126(1-3), 頁碼.77-87
10/2002

摘要

Electron microscopy Lead Multi-photon photoemission Pentacene Silicon Electronic Optical and Magnetic Materials Radiation Atomic and Molecular Physics and Optics Condensed Matter Physics Spectroscopy Physical and Theoretical Chemistry
The interaction of intense, pulsed laser radiation with surfaces results in non-linear optical effects that are responsible for emission of electrons even if the photon energies are below the work function. In the present study, photoelectrons have been excited by means of femtosecond laser pulses from a frequency doubled Ti:sapphire laser with a photon energy of 3.1 eV. The spatial distribution of the photo emitted electrons was imaged using a photoemission electron microscope. All samples exhibit centres of enhanced second or higher order photoemission yield, so called 'hot spots'. These 'hot spots' were preferentially excited with s-polarised light. This behaviour may be explained on the basis of a microscopic model assuming localised plasmon excitations in small particles. Lead films and pentacene layers adsorbed on silicon have been studied. The photoelectron yield depends strongly on the sample topography and the polarisation of the photons. The polarisation and power dependence of the multi-photon photoemission yield were studied. Clear evidence for three-photon contributions has been found although two-photon photoemission is sufficient to overcome the surface barrier. © Elsevier Science B.V. All rights reserved.

相關連結

指標

1 檢視次數

詳細資料

Logo image