Abstract
A new method, multiple-wave diffraction anomalous fine structure, combining the x-ray multiple-wave diffraction and diffraction anomalous fine structure techniques, is proposed. The real part of dispersion correction Δf′ and fine structure χ function can be obtained directly by multiple diffraction analysis without using Kramers-Krönig relations and kinematical fitting of diffracted intensity. Better wave vector sensitivity of the fine structure is expected. The multiple-wave diffraction anomalous fine structure experiment for a GaAs single crystal is reported as an example. © 2006 The American Physical Society.