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Nano-scale observation of frictional deformation at Ag single point contact with MEMS-in-TEM setup
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Nano-scale observation of frictional deformation at Ag single point contact with MEMS-in-TEM setup

隆昭 佐藤, Tadashi Ishida, Shinsuke NabeyaHiroyuki Fujita
Journal of Physics: Conference Series, 卷.258(1)
01/11/2010

摘要

nano-scale;MEMS;TEM

Monitoring atomic-level deformation of a frictional interface in real time is crucial for tribology research at micro and nano scale. We have combined nano-scale handling capabilities of MEMS technology with the supreme observation ability of TEM and developed a MEMS-in-TEM experimental setup. We succeeded in observing the frictional deformation of silver interface and measuring its shear force simultaneously.

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url
https://doi.org/10.1088/1742-6596/258/1/012005檢視
已出版(紀錄版本) 開放

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