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Nanoscale measurement of giant saturation magnetization in α″-Fe                                                 16                                                 N                                                 2                                                  by electron energy-loss magnetic chiral dichroism
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Nanoscale measurement of giant saturation magnetization in α″-Fe 16 N 2 by electron energy-loss magnetic chiral dichroism

Xinfeng Chen, Soma Higashikozono, Keita Ito, Lei Jin, Ping-Luen Ho, Chu-Ping Yu, Nyan-Hwa Tai, Joachim Mayer, Rafal E. Dunin-Borkowski, Takashi Suemasu, …
Ultramicroscopy
2019

摘要

Electron energy-loss magnetic chiral dichroism Giant saturation magnetization Rare-earth-free permanent magnetic materials α″-Fe 16 N 2 , high spatial resolution Electronic Optical and Magnetic Materials Atomic and Molecular Physics and Optics Instrumentation
Metastable α″-Fe 16 N 2 thin films were reported to have a giant saturation magnetization of above 2200 emu/cm 3 in 1972 and have been considered as candidates for next-generation rare-earth-free permanent magnetic materials. However, their magnetic properties have not been confirmed unequivocally. As a result of the limited spatial resolution of most magnetic characterization techniques, it is challenging to measure the saturation magnetization of the α″-Fe 16 N 2 phase, as it is often mixed with the parent α′-Fe 8 N phase in thin films. Here, we use electron energy-loss magnetic chiral dichroism (EMCD), aberration-corrected transmission electron microscopy, X-ray diffraction and macroscopic magnetic measurements to study α″-Fe 16 N 2 (containing ordered N atoms) and α′-Fe 8 N (containing disordered N atoms). The ratio of saturation magnetization in α″-Fe 16 N 2 to that in α′-Fe 8 N is determined to be 1.31 ± 0.10 from quantitative EMCD measurements and dynamical diffraction calculations, confirming the giant saturation magnetization of α″-Fe 16 N 2 . Crystallographic information is also obtained about the two phases, which are mixed on the nanoscale.

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