摘要
A novel approach to convert a 2D WSe2 film into a WOx film by the laser-induced oxidation process using a nickel (Ni) adsorption layer, namely Ni-assisted laser oxidation process, was demonstrated. A layer of Ni metal was deposited to absorb the heat of the laser and oxidize the top WSe2 layer, for which an aluminum oxide (Al2O3) layer is then deposited as a barrier layer. A continuous wave laser with a wavelength of 808 nm is selected as the laser source, as it is not absorbed by the WSe2 layer. By introducing a patterned Ni layer, the selective oxidation process on WSe2 into WO3 can be achieved owing to the photothermal effects caused by the Ni layer with O2 gas. The successful oxidation parameters, including laser powers and irradiation durations with a fixed Al2O3 barrier layer thickness of 50 nm, were investigated. Resistive random-access memory (RRAM) devices fabricated using the Ni-assisted laser-oxidized WO3 structure exhibit clear resistive switching behavior compared to the structure without the laser oxidation process. In addition, the Ni-assisted laser-oxidized WO3 structure showed obvious surface enhanced Raman spectroscopy (SERS) signals of crystal violet (CV) and methylene blue (MB) with the lowest concentration of 10-6 M.