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Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe
Journal article   Peer reviewed

Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

T.N. Horsky, G.R. Brandes, K.F. Canter, C.B. Duke, S.F. Horng, A. Kahn, D.L. Lessor, A.P. Mills Jr., A. Paton, K. Stevens, …
Physical Review Letters, Vol.62(16), pp.1876-1879
1989
DOI: https://doi.org/10.1103/PhysRevLett.62.1876

Abstract

Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles. © 1989 The American Physical Society.

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