Abstract
We report the application of thermal mechanical analysis (t.m.a.) to studying the crystallization behaviour of poly(ether ether ketone) (PEEK). We are able to show that the two crystallization stages of PEEK are clearly distinguished by measuring the variation of film thickness with time during isothermal crystallization. These two crystallization stages cannot be readily distinguished by d.s.c. The distinction by t.m.a. becomes less clear with increasing crystallization temperature due to overlap of the two crystallization stages. © 1993.