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Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller
Journal article

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Chen-Fu Chien, Ying-Jen Chen, Chia-Yu Hsu and 宏鍇 王
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING,, Vol.11(2), pp.473-484
2014

Abstract

Advanced process control (APC);manufacturing intelligence;overlay errors;proportional-integral controller;run-to-run (R2R) control;yield enhancement

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