- Title
- Oxide Thickness Characterization: Models for Quantum Effect
- Creators - without role
- K. YangC. HuY. C. King - 國立清華大學電機資訊學院電機工程學系
- Publication Details
- Solid State Technology, Vol.6, p.51
- Identifiers
- 9957772054206774
- Academic Unit
- Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Journal article
Journal article
Oxide Thickness Characterization: Models for Quantum Effect
Solid State Technology, Vol.6, p.51
1999
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