摘要
In the perovskite-type Ca 1-x Ce x MnO 3 (CCMO), one can control the transport and magnetic properties through varying Ce content. In the case of thin films, the properties can also be controlled by epitaxial strain from the substrate through changing it such as YAlO 3 (YAO), NdAlO 3 (NAO), and LaSrAlO 4 (LSAO). However, one cannot measure the magnetization of thin films on NAO substrates by conventional magnetization measurements because of the strong paramagnetic signals from the Nd 3+ ions. In order to eliminate the influence of Nd 3+ and to identify magnetic phases of the CCMO thin films, we have performed element-selective X-ray magnetic circular dichroism (XMCD) measurements of the Mn 2p core level. By studying the anisotropy of the XMCD intensity, we could unambiguously determine the magnetic phase diagram of the CCMO thin films.