Logo image
Physical origins of nonlinearity in InP double heterojunction bipolar transistors
Journal article   Peer reviewed

Physical origins of nonlinearity in InP double heterojunction bipolar transistors

H. Xu, E. W. Iverson, KEH-YUNG CHENG and M. Feng
Applied Physics Letters, Vol.100(11), 113508
12/03/2012

Abstract

Two tone inter-modulation distortion measurements were performed at 18 GHz to characterize the nonlinearity of Type-I InP/InGaAs/InP and Type-I/II AlInP/GaAsSb/InP double heterojunction bipolar transistors (DHBTs). Two-dimensional hydrodynamic (HD) simulations were also performed, showing that the base push-out and charge accumulation effects are the dominant physical origins of nonlinearity for the Type-I DHBT at high current densities. Comparatively, the Type-I/II DHBT exhibits no such effects. Hence, we conclude that DHBTs having a Type-I/II energy band alignment will have an inherent linearity advantage compared to DHBTs with the Type-I energy band alignment. © 2012 American Institute of Physics.

Metrics

1 Record Views

Details

Logo image