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Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy
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Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy

Y.C. Chang, C.C. Chang, J.C. Wu, Z.H. Wei, M.F. Lai 和 C.R. Chang
IEEE Transactions on Magnetics, 卷.42(10), 頁碼.2963-2965
2006
DOI: https://doi.org/10.1109/TMAG.2006.878421

摘要

Hall effect devices magnetic force microscopy (MFM) magnetic recording magnetoresistance Electronic Optical and Magnetic Materials Electrical and Electronic Engineering
A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration. © 2006, IEEE. All rights reserved.

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