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Process-resilient low-jitter all-digital pll via smooth code-jumping
Journal article   Peer reviewed

Process-resilient low-jitter all-digital pll via smooth code-jumping

Pei-Ying Chao, Chao-Wen Tzeng, Shi-Yu Huang, Chia-Chieh Weng and Shan-Chien Fang
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.21(12), pp.2240-2249
2013

Abstract

All-digital phase-locked loop (ADPLL) digitally controlled oscillator (DCO) smooth code-jumping
For an all-digital phase-locked loop, the frequency range supported is often segmented, and this could cause significant jitter when the operating condition (such as the supply voltage and/or the temperature) changes. To address this issue, we present a scheme, called smooth code-jumping, that can stitch together the segmented frequency profile of a digitally controlled oscillator (DCO) into a continuous range, and thereby reduce the jitter significantly. This scheme incorporates a new mirror-DCO-based calibration scheme to take into account process variations. We validate this scheme by test chips in 0.18-μm CMOS technology. Measurement results show that, when operating at 1 GHz, the rms jitter is 4.3 ps (0.43%UI) and the peak-to-peak jitter is 35.6 ps (3.56%UI), respectively. © 1993-2012 IEEE.

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