RAISIN: A tool for evaluating redundancy analysis schemes in reparable embedded memories

Journal article

Peer reviewed

R.-F. Huang, J.-F.-Li, J.-C. Yeh and C.-W. Wu

IEEE Design & Test of Computers, Vol.24(3)

2007

Abstract

RAISIN;tool;redundancy analysis schemes;reparable;embedded memories

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Title: RAISIN: A tool for evaluating redundancy analysis schemes in reparable embedded memories
Creators - without role: R.-F. Huang
J.-F.-Li
J.-C. Yeh
C.-W. Wu - 國立清華大學電機資訊學院電機工程學系
Identifiers: 9957769407306774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Journal article
Publication Details: IEEE Design & Test of Computers, Vol.24(3)