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Rearward movement of the heel at heel strike
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Rearward movement of the heel at heel strike

Raymond W. McGorry, Chien-Chi ChangAngela DiDomenico
Applied Ergonomics, 卷.39(6), 頁碼.678-684
2008
PMID: 18280459

摘要

Aging Backswing Gait Kinematics Micro-slip Slip distance Human Factors and Ergonomics Physical Therapy Sports Therapy and Rehabilitation Safety Risk Reliability and Quality Engineering (miscellaneous)
This paper describes the observation of rearward movement (RM) of the heel following heel strike occurring during normal gait. Thirty-one participants recruited as part of a larger study on slip kinematics walked the length of an 8-m runway at a speed of 1.5 m/s. Several floor surfaces, presented dry and with contaminant, were used for the purpose of eliciting a wide range of small slip distances. The normal force applied to a forceplate mounted in the runway was used to identify heel strike, as well as to calculate the utilized coefficient of friction during early stance phase. A motion analysis system tracked the displacement of two heel-mounted markers, and the data were used to derive kinematic variables related to the heel strike event. Results showed that RMs occurred in 18.1% of 494 trials, with a mean rearward displacement of 5.02 (±3.68) mm. When present, RMs occurred in close temporal proximity to heel strike, typically completing RM within 40 ms of the heel strike event. When divided into groups by age, older participants (>40 years) were more than twice as likely to have RMs as younger participants. When grouped by height or weight, differences in the proportion of trials with RMs were small. In trials where RMs were observed, forward slip distances were significantly less than for trials with no RMs, 2.17 (±3.87) mm vs. 12.58 (±10.71) mm, respectively. The time until the heel stopped moving during the post-heel strike period was not significantly different between RM and non-RM trials. Further investigation of this gait feature may improve understanding of normal gait patterns and may have implications for future slipmeter development. © 2008 Elsevier Ltd. All rights reserved.

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