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Residual stress effects and t → m transformation in ion-implanted yttria-stabilized zirconia
Journal article   Peer reviewed

Residual stress effects and t → m transformation in ion-implanted yttria-stabilized zirconia

Jenq-Gong Duh and Yunn-Sheng Wu
Journal of Materials Science, Vol.26(23), pp.6522-6526
1991

Abstract

Materials Science (all) Mechanics of Materials Mechanical Engineering
Ion-beam treatment affects the near surface region of ceramic materials and is a potential technology in altering the surface microstructure and properties. In this study, a preliminary surface modification in yttria-stabilized zirconia was investigated through the employment of ion implantation. Fracture toughness and hardness were measured and evaluated by the indentation method for specimens implanted by direct As + bombardment. With the aid of residual stress measurement by X-ray diffraction, the properties of the implanted specimens can be related to the residual compressive stress induced by irradiation effects. Thermal stability of zirconia is improved due to the suppression of the tetragonal to monoclinic transformation in the presence of the residual compressive stress. © 1991 Chapman & Hall.

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