Logo image
Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction
Journal article   Peer reviewed

Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction

C.-H. Ma, J.-H. Huang and Haydn Chen
Thin Solid Films, Vol.418(2), pp.73-78
15/10/2002

Abstract

cos2 sin2 method Residual stress Textured thin film
Measurements of residual stresses in textured thin films have always been problematic. In this article, a new experimental method using grazing-incidence X-ray diffraction is presented with its principles based upon the conventional sin 2 ψ method. Instead of using the Bragg-Brentano (B-B) or Seemann-Bohlin geometry, the proposed method utilizes an asymmetrical diffraction geometry for which the X-ray beam is incident at a grazing angle γ to the sample surface, while the angle ψ is the tilt angle of the sample surface as defined by the conventional sin 2 ψ method. Basic equations involved in the X-ray residual stress analysis are described, along with exemplified experimental data. Analysis shows that, for an isotropic medium, strain measured using this grazing-incidence geometry assumes a linear relationship with the geometrical parameter cos 2 α sin 2 ψ, where the angle α is a constant and is defined as the Bragg angle at ψ = 0°, θ o , minus the grazing incidence angle γ, i.e. α = θ o -γ. The grazing-incidence diffraction geometry effectively increases the irradiation volume from a thin-film specimen, thereby giving rise to higher intensity for high-angle Bragg peaks than the conventional B-B geometry. The proposed analysis has another advantage, in that the inhomogeneous sample casts little effect on the residual stress results when compared to the traditional sin 2 ψ method. © 2002 Elsevier Science B.V. All rights reserved.

Metrics

1 Record Views

Details

Logo image