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Room temperature two-terminal characteristics in silicon nanowires
Journal article   Peer reviewed

Room temperature two-terminal characteristics in silicon nanowires

S.F. Hu, W.Z. Wong, S.S. Liu, Y.C. Wu, C.L. Sung and T.Y. Huang
Solid State Communications, Vol.125(6), pp.351-354
02/2003

Abstract

A. Nanostructures B. Nanofabrications D. Tunnelling
Quantum effects in silicon nanowires due to one-dimensional carrier confinement were observed at room temperature. Electrical transport properties were measured on narrow thin-silicon-on-insulator wires that were defined by e-beam lithography and further narrowed and thinned down by oxidation to a final thickness of around 3 nm, and a width of 29 nm. The room temperature current-voltage characteristics of the resulting silicon nanowires are shown to exhibit a zero current state may be due to the occurrence of Coulomb blockade. © 2003 Elsevier Science Ltd. All rights reserved.

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