Rutherford backscattering spectroscopy analysis of Ar+ implanted ytrria stabilized zirconia

Journal article

Peer reviewed

J.G. Duh, Y.S. Wu and B.S. Chiou

Journal of Materials Science Letters, Vol.9(8), pp.916-918

08/1990

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Title: Rutherford backscattering spectroscopy analysis of Ar+ implanted ytrria stabilized zirconia
Creators - without role: J.G. Duh - National Tsing Hua University
Y.S. Wu - National Tsing Hua University
B.S. Chiou - Institute of Electronics , National Chiao Tung University
Publication Details: Journal of Materials Science Letters, Vol.9(8), pp.916-918
Identifiers: 9957768570006774
Academic Unit: National Tsing Hua University
Language: English
Resource Type: Journal article