SRAM built-in self-test and built-in self-diagnosis

Journal article

SRAM built-in self-test and built-in self-diagnosis

C.-W. Wang, C.-F. Wu, J.-F. Li, R.-F. Huang and C.-W. Wu

IC Design Magazine, Vol.32, pp.46-62

12/2002

Abstract

SRAM;self-test;self-diagnosis

semiconductor;Electrical engineering

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Title: SRAM built-in self-test and built-in self-diagnosis
Creators - without role: C.-W. Wang
C.-F. Wu
J.-F. Li
R.-F. Huang
C.-W. Wu
Publication Details: IC Design Magazine, Vol.32, pp.46-62
Identifiers: 9957771391606774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Journal article