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Scanning tunneling microscopy of step bunching on vicinal GaAs(100) annealed at high temperatures
Journal article   Peer reviewed

Scanning tunneling microscopy of step bunching on vicinal GaAs(100) annealed at high temperatures

S. L. Skala, S. T. Chou, KEH-YUNG CHENG, J. R. Tucker and J. W. Lyding
Applied Physics Letters, Vol.65(6), pp.722-724
1994

Abstract

Step bunching and terrace widening are observed with scanning tunneling microscopy on GaAs(100), tilted 2°toward [1̄10] and [110], after annealing in ultrahigh vacuum at 600°C. The resulting surface consists of two separate phases, c(8×2) reconstructed terraces and a bunched step region that is either amorphous or (2×6) reconstructed. Average terrace widths increase to 2 or 4 times the nominal average terrace width for a 2°miscut and steps are correspondingly compressed by 40% or 75% depending on the misorientation direction. The observed step bunching is explained by a thermodynamic instability against facetting resulting from a high step energy on c(8×2) reconstructed surfaces.

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